Abdul Amir, Haider F. and Chee, Fuei Pien (2011) Evaluation of static performance of optoelectronic semiconductor devices under X-rays irradiation. In: International Conference on X-ray and Related Techniques in Research and Industry (IXCRI 2010), 9-10 June 2010, Kedah, Malaysia.
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Official URL: http://dx.doi.org/10.4028/www.scientific.net/AMR.1...
In this research, optoelectronic devices consisted of an infrared light emitting diode and a phototransistor with no special handling or third party-packaging were irradiated to ionizing radiation utilizing x-rays. It was found that the devices under test (DUTs) undergo performance degradation in their functional parameters during exposure to x-rays. These damaging effects are depending on their current drives and also the Total Ionizing Dose (TID) absorbed. The TID effects by x-rays are cumulative and gradually take place throughout the lifecycle of the devices exposed to radiation. © (2011) Trans Tech Publications, Switzerland.
|Item Type:||Conference Paper (UNSPECIFIED)|
|Uncontrolled Keywords:||Optoelectronic, Total Ionizing Dose (TID), X-rays, Current drives, Damaging effects, Devices under tests, Functional parameters, Infrared light emitting diodes, Optoelectronic, Optoelectronic semiconductor devices, Performance degradation, Static performance, Third parties, Total ionizing dose|
|Subjects:||?? TA1501-1820 ??|
?? TK8300-8360 ??
|Divisions:||SCHOOL > School of Science and Technology|
|Deposited By:||IR Admin|
|Deposited On:||10 Mar 2011 12:35|
|Last Modified:||08 Sep 2014 15:24|
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