Saafie Salleh, and Harvey, N. Rutt and Mohd Noh Dalimin, and Muhamammad Mat Salleh, (2011) Cold deposition of zinc sulfide optical waveguides using thermoelectric device. Advanced Materials Research, 264-265 . pp. 856-861. ISSN 1022-6680
Official URL: http://dx.doi.org/10.4028/www.scientific.net/AMR.2...
Zinc sulfide (ZnS) thin films as the waveguide medium have been deposited onto oxidized silicon wafer substrates at cold temperature (Tcold = -50°C) and ambient temperature (Tambient = 25°C) by thermal evaporation technique. The surface morphology of ZnS films were pictured with an atomic force microscopy (AFM) and the surface roughness were calculated from the AFM images. The propagation losses of the samples were measured using a scanning detection technique attached to a prism coupler. The AFM results revealed that the surface of cold deposited ZnS film is rougher than the surface of ambient deposited ZnS film. The propagation losses of the cold deposited ZnS waveguide are consistently lower than the ambient deposited ZnS waveguide at all measured wavelengths.
|Uncontrolled Keywords:||Cold deposition, Propagation loss, Surface roughness, ZnS waveguide, AFM, AFM image, Cold deposition, Cold temperatures, Detection technique, Oxidized silicon wafers, Prism coupler, Propagation loss, Thermal evaporation technique, Thermoelectric devices, ZnS films, ZnS waveguide, Atomic force microscopy, Deposition, Films, Semiconducting silicon compounds, Silicon oxides, Silicon wafers, Surface morphology, Surface properties, Surface roughness, Surfaces, Thermal evaporation, Waveguides, Zinc, Zinc sulfide|
|Subjects:||T Technology > TA Engineering (General). Civil engineering (General)|
|Divisions:||SCHOOL > School of Science and Technology|
|Deposited By:||IR Admin|
|Deposited On:||03 Oct 2012 15:28|
|Last Modified:||17 Feb 2015 11:32|
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