Surface roughness of thermally evaporated ZnS optical waveguides

Saafie Salleh and Abdullah Chik, and Mohd Noh Dalimin and Muhamad Mat Salleh and Rutt, H. N. (2006) Surface roughness of thermally evaporated ZnS optical waveguides. In: 2005 Asian Conference On Sensors And The International Conference On The New Techniques In Pharmaceutical And Biomedical Research, 5-7 Sept 2005, Kuala Lumpur, Malaysia.

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In this study, the propagation loss and the surfaces of ZnS thin films on silicon substrates have been investigated. ZnS thin films have been prepared by thermal evaporation at two different substrate temperatures, which were at ambient temperature and at °50°C. The propagation losses were measured with scanning detection technique attached to a prism coupling and the thin film surfaces were characterized with an atomic force microscope. The waveguide propagation loss of ambient deposited film is 131.50 dB/cm whereas the loss of cold deposited film is 20.41 dB/cm. The surface roughness of the waveguide is enhanced for cold evaporated ZnS film.

Item Type: Conference or Workshop Item (UNSPECIFIED)
Keyword: ZnS, Silicon substrates, Thermal evaporation, Waveguides,
Subjects: T Technology > TA Engineering (General). Civil engineering (General) > TA1-2040 Engineering (General). Civil engineering (General) > TA1501-1820 Applied optics. Photonics
Department: SCHOOL > School of Science and Technology
Depositing User: ADMIN ADMIN
Date Deposited: 14 Feb 2011 17:17
Last Modified: 29 Dec 2014 16:31

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