Abdul Amir, Haider F. and Abdulah Chik (2009) Neutron radiation effects on metal oxide semiconductor (MOS) devices. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 267 (18). pp. 3032-3036. ISSN 0168-583X
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Abstract
The main purpose of this study is to provide the knowledge and data on Deuterium-Tritium (D-T) fusion neutron induced damage in MOS devices. Silicon metal oxide semiconductor (MOS) devices are currently the cornerstone of the modern microelectronics industry. However, when a MOS device is exposed to a flux of energetic radiation or particles, the resulting effects from this radiation can cause several degradation of the device performance and of its operating life. The part of MOS structure (metal oxide semiconductor) most sensitive to neutron radiation is the oxide insulating layer (SiO2). When ionizing radiation passes through the oxide, the energy deposited creates electron-hole pairs. These electron-hole pairs have been seriously hazardous to the performance of these electronic components. The degradation of the current gain of the dual n-channel depletion mode MOS caused by neutron displacement defects, was measured using in situ method during neutron irradiation. The average degradation of the gain of the current is about 35 mA, and the change in channel current gain increased proportionally with neutron fluence. The total fusion neutron displacement damage was found to be 4.8 × 10-21 dpa per n/cm2, while the average fraction of damage in the crystal of silicon was found to be 1.24 × 10-12. All the MOS devices tested were found to be controllable after neutron irradiation and no permanent damage was caused by neutron fluence irradiation below 1010 n/cm2. The calculation results shows that (n,α) reaction induced soft-error cross-section about 8.7 × 10-14 cm2, and for recoil atoms about 2.9 × 10-15 cm2, respectively. © 2009 Elsevier B.V. All rights reserved.
| Item Type: | Article |
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| Keyword: | Current gains, Deuterium-tritium, Device performance, Electron hole pairs, Electronic component, Energetic radiation, Fusion neutrons, In situ, In-channels, In-situ methods, Induced damage, Insulating layers, Metal oxide semiconductor, Modern microelectronics, MOS and neutron, MOS structure, N-channel, Neutron displacement, Neutron fluences, Neutron radiation effects, Neutron radiations, Operating life, Permanent damage, Recoil atoms, Degradation, Deuterium, Excitons, Field effect transistors, Ionization, Ionizing radiation, Metallic compounds, Microelectronics, MOS devices, Neutrons, Radiation effects, Semiconducting silicon, Semiconducting silicon compounds, Semiconductor devices, Silicon oxides, Structural metals, Tritium |
| Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering > TK1-9971 Electrical engineering. Electronics. Nuclear engineering > TK7800-8360 Electronics |
| Department: | SCHOOL > School of Science and Technology |
| Depositing User: | ADMIN ADMIN |
| Date Deposited: | 30 Mar 2011 12:21 |
| Last Modified: | 30 Jul 2021 13:42 |
| URI: | https://eprints.ums.edu.my/id/eprint/2605 |
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