Khairul Anuar Mohamad and Afishah Alias and Ismail Saad and Uesugi, Katsuhiro and Fukuda, Hisashi (2012) All-polymer organic field-effect transistors with memory element. In: 3rd International Conference on Intelligent Systems, Modelling and Simulation (ISMS 2012) , 8-10 February 2012, Kota Kinabalu, Sabah, Malaysia.
Full text not available from this repository.Abstract
We introduce an hole-accepting layer on a poly(methyl methacrylate) (PMMA) dielectric to investigate the reversible threshold voltage (Vth) shifts in all-polymer nchannel organic field-effect transistor (OFET) using an organic semiconductor of an poly{[N,N'-bis(2-octyldodecyl)- naphthalene-1,4,5,8- bis(dicarboximide)-2,6-diyl]-alt-5,5'-(2,2'- bithiophene)} (P(NDI2OD-T2)). Top drain-source with a bottom-gate contact structure device exhibited a unipolar property with n-channel behavior. Furthermore, the existence of poly(3-hexylthiophene) (P3HT) films as a hole-accepting-like storage layers resulted in a reversible V th shifts upon the application of external gate bias (V bias). Hence, all-polymer organic transistor with the hole-accepting layer exhibited a large memory window (ΔV th = 10.7 V) for write and erase electrically without major degradation in saturation mobility (μ sat = 1.8∼2.8×10 ¯ⴠcm ² V ¯¹, s ¯¹).
Item Type: | Conference or Workshop Item (UNSPECIFIED) |
---|---|
Keyword: | N-channel, Nonvolatile memory, Organic fieldeffect transistor, Organic semiconductor, Bithiophenes, Contact structure, Gate bias, Memory element, Memory window, N-channel, Non-volatile memories, Organic transistor, Poly-3-hexylthiophene, Saturation mobility, Storage layers, Esters, Intelligent systems, Naphthalene, Organic field effect transistors, Polymers, Semiconducting organic compounds, Semiconductor devices, Hole mobility |
Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering > TK1-9971 Electrical engineering. Electronics. Nuclear engineering > TK7800-8360 Electronics |
Department: | SCHOOL > School of Engineering and Information Technology |
Depositing User: | ADMIN ADMIN |
Date Deposited: | 10 Dec 2012 15:50 |
Last Modified: | 18 May 2015 11:36 |
URI: | https://eprints.ums.edu.my/id/eprint/5581 |
Actions (login required)
View Item |