Items where Author is "Kang, Eng Siew"

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Proceedings

Bunseng, Chan and Charlie Soh and Kang, Eng Siew and Hui, Seng Kheong and Lim, Wei Jer and Ismail Saad and Nurmin Bolong (2021) High-k gate dielectric nano-FET leakage current analysis.

This list was generated on Thu Jul 18 05:54:19 2024 +08.